1/16/2012

Monte Carlo Modeling for Electron Microscopy and Microanalysis (Monte Carlo Modelling for Electron Microscopy & Microanalysi) Review

Monte Carlo Modeling for Electron Microscopy and Microanalysis (Monte Carlo Modelling for Electron Microscopy and Microanalysi)
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This book provides a good introduction into Monte Carlo simulation for so-called microbeam analysis.
I read this book to start up my work on image formation of scanning electron microscopy. This book was really useful to understand how the Monte Carlo technique could be realized in my lap-top.
Although the author provides a complete set of PASCAL codes,
it was not difficult to convert them into C/C++ based my programming codes.
This book contains many references, mainly journal papers.
So advanced modificaion may require ones to read these articles.
But without this kind of text book,
the analysis by Monte Carlo technique would be more difficult.
To understand the physical background of electron transport in a specimen,
I recommend to read SEM text books by Reimer or by Goldstein et al.


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This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis.Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid.Optimized for use on personal computers, the programs provide a real time graphical display of the interaction.The programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope, including backscattering, secondary electron production, EBIC and cathodo-luminescence imaging, and X-ray microanalysis.The computer code is given in a fully annotated format so that it may be readily modified for specific problems.Throughout, the author includes numerous examples of how such applications can be used. Students and professionals using electron microscopes will want to read this important addition to the literature.

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